Keithley sponsors contest to reward excellence in the development of electrical measurement techniques for nanotech materials and devices.

The contest is now completed. Thank you for visiting.

As researchers and engineers grapple with the significant challenges of miniaturization and nanotechnology, electrical measurements play a pivotal role in developing new materials and devices—even those not intended for electronic applications. To encourage development and propagation of improved test techniques, Keithley is sponsoring a contest to reward those using Keithley equipment to advance nanotech measurement art. Editors of R&D Magazine will judge the entries. The contest is open to Keithley equipment users involved with electrical measurements on nanotech materials and devices who feel they have made innovations in test and measurement techniques. See complete contest rules.

Monetary prizes for the three best entries will be:

• 1st Place: $2,500.00
• 2nd Place: $1,500.00
• 3rd Place: $1,000.00

Editors of R&D Magazine will judge the entries according to the following criteria, and the judges' decisions will be final:

• How the test techniques have advanced the state of the art in electrical measurements on nanotechnology materials or devices.
• Advantages of the instruments and new techniques compared to earlier test solutions.
• Level of accuracy, sensitivity, and resolution achieved in the measured variables.
• Amount of time required for data collection.

Researchers and engineers using Keithley equipment in any of the diverse nanotechnology disciplines—electronics, biotechnology, structural materials, etc.—are encouraged to complete and submit a contest entry form describing their measurement application and how they overcame challenges associated with it.

The contest is now completed. Thank you for visiting.

Entries must be submitted by end of day August 31, 2006.

More about Keithley's Nanotech Measurement Contest:

• Contest Entry Form
• Contest Rules